000			01601nam a2200325 a 4500
008			001206s2001 enka 001 0 eng
020			_a9780471056690
020			_a9780471056690 _cNo price
100	1		_aDuda, Richard O.
245	1	0	_aPattern classification
250			_a2nd ed. / _bRichard O. Duda, Peter E. Hart, David G. Stork
260			_aNew York ; _aChichester : _bWiley, _c[2001]
300			_axx, 654 p. : _bill. ; _c27 cm
490		2	_aA Wiley-Interscience publication
504			_aIncludes bibliographical references and index
520			_aThe first edition, published in 1973, has become a classic reference in the field. Now with the second edition, readers will find information on key new topics such as neural networks and statistical pattern recognition, the theory of machine learning, and the theory of invariances. Also included are worked examples, comparisons between different methods, extensive graphics, expanded exercises and computer project topics
534			_aPrevious ed.: published as Pattern classification and scene analysis. New York : London: Wiley-Interscience, 1973
650		0	_aPattern recognition systems
650		0	_aStatistical decision _913126
650		7	_aElectronics & communications engineering _2thema
650		7	_aMaths for computer scientists _2thema
650		7	_aPattern recognition _2thema
650		7	_aMaths for engineers _2thema
700	1		_aHart, Peter E. _q(Peter Elliot), _d1941-
700	1		_aStork, David G.
902			_a170103
907			_a.b11019852 _bm _c-
942			_n0
998			_b1 _c031205 _dm _ea _f- _g0
999			_c59839 _d59839