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High resolution X-ray diffractometry and topography / D. Keith Bowen and Brian K. Tanner.

By: Contributor(s): Material type: TextTextPublication details: London : Taylor & Francis, c1998.Description: x,252p. : ill. 28cmISBN:
  • 9780850667585
  • 9780850667585
Subject(s): DDC classification:
  • 548.83
Summary: The application of electronic materials has created a demand for reliable techniques for examining these materials. This book looks at the area of x-ray diffraction and the modern techniques available for deployment in research. It provides the background for applying these techniques.
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Item type Current library Call number Status Date due Barcode
General General ATU Dublin Road General Shelves 548.83 (Browse shelf(Opens below)) Available 065053

Includes index.

Includes bibliographical references and index.

The application of electronic materials has created a demand for reliable techniques for examining these materials. This book looks at the area of x-ray diffraction and the modern techniques available for deployment in research. It provides the background for applying these techniques.

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